Johns Hopkins University Applied Physics Laboratory Analog, Digital, RF and Mixed
Job Location: Laurel, MD
Department: Space Department
Salary: Varies with skills/education/experience
Education: See Experience
Experience: Required: Minimum Bachelor Science Degree in Electrical Engineering, Physics or related field, or equivalent level of experience. Minimum 5 years of experience in electronic testing of analog, digital and mixed signal components and the use of automatic test equipment (ATE). Familiarity with Visual BASIC and/or C programming languages and UNIX operating systems. Familiarity with basic and advanced laboratory and bench test instruments. Familiarity with programmable temperature forcing systems (PTFS), electrostatic discharge (ESD) prevention procedures and handling plastic encapsulated microelectronic (PEM) components. Desired: Experience with setting up GPIB or IEEE-488 based test equipment and Labview software environment. Familiarity with ITS-9000 Digital Test Systems, SZ-3650 Mixed Signal Testers and Analog Devices LTS-2020 and RF test systems such as Agilent 9300. Effective written and oral communication skills. Familiarity with NASA test procedures such as EEE-INST-002 (Screening and Qualification Test Requirements). Ability to solder components to printed circuit boards and/or vector boards.
Job Description: Support the Space Component Engineering (SEC) group in the following areas: (1) Development of test hardware and software to perform electrical tests of Analog. Digital, RF and Mixed Signal components; (2) Performance of radiation evaluations of electrical components. Such testing includes Total Irradiation Dose (TID), Single Event Effects (SEE), Enhanced Low Dose Rate Sensitivity (ELDRS), etc and (3) Development of test circuits for the performance of Burn-in, Life Test and HAST tests. Development of test hardware and software using automatic Test Equipment (ATE) and/or Bench Test Equipment such as oscilloscopes, power supplies, multimeters, RF equipment, etc. Performance of Total Irradiation Dose (TID), Single Event Effects (SEE), Enhanced Low Dose Rate Sensitivity (ELDRS), etc. Development of test circuits for Burn-in, Life Test and HAST test.
Contact Info: Go to http://www.jhuapl.edu/employment.
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Reference Code Number: 81347
Johns Hopkins University Applied Physics Laboratory
EOE/M/F/D/V
How to Apply:
Go the the JHU/APL Employment Page link below and select "Search and apply".
Then, select "Advanced Search".
Enter the Reference Code number below into Job Req # box and click the Search button. Select job for Job Basket. Click Apply for Job(s) in Job Basket button and follow the instructions to complete the on-line application process.
